Similar Items: Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy
- Spectroscopy of 22Mg relevant to explosive nucleosynthesis in classical novae and X-ray bursts
- Hand X-ray absorptiometry for measurement of bone mineral density on a slot-scanning X-ray imaging system
- Distortion Correction in LODOX StatScan X-Ray Images
- A critical evaluation of quantitative and qualitative analysis by means of energy-dispersive X-ray measurement in a scanning electron microscope
- Non -destructive measurement of citrus internal quality using near infrared spectroscopy and x-ray computed temography
- Radioisotope X-ray fluorescence
Author: Britton, David T
- Microstructure, stress and defect evolution under illumination in hydrogenated amorphous silicon (a-Si:H)
- Production and characterisation of nanoparticulate silicon photovoltaic devices
- Modelling of defect states in covalent amorphous solids
- Microstructure and residual stress in hydrogenated amorphous silicon (a-Si:H) layers
- Fully printed transistors employing silicon nanoparticles
- Probabilistic methods applied to fluctuating systems