Similar Items: Microstructure and residual stress in hydrogenated amorphous silicon (a-Si:H) layers
- Microstructure, stress and defect evolution under illumination in hydrogenated amorphous silicon (a-Si:H)
- Light induced degradation in hydrogenated amorphous silicon (a-Si:H)
- Growth temperature and microstructural differences in hydrogenated amorphous silicon deposited on glass substrates
- Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques
- Electrical characterisation of simple a-Si:H and nc-Si devices on paper substrates deposited by hot wire chemical vapour deposition and printing techniques
- Electronic properties and microstructure of nanoparticulate silicon systems for diode applications
Author: Britton, David T
- Microstructure, stress and defect evolution under illumination in hydrogenated amorphous silicon (a-Si:H)
- Production and characterisation of nanoparticulate silicon photovoltaic devices
- Modelling of defect states in covalent amorphous solids
- Microstructure and residual stress in hydrogenated amorphous silicon (a-Si:H) layers
- Fully printed transistors employing silicon nanoparticles
- Probabilistic methods applied to fluctuating systems