Similar Items: Electrical characterization of ZnO and metal ZnO contacts
- The characterization of bulk as-grown and annealed ZnO by the Hall effect
- Electrical characterization of process, annealing and irradiation induced defects in ZnO
- Investigating the use of indirect sensing techniques to reduce the effect of geometrical correction factors in semiconductor Hall effect plates
- Ohmic contacts to cadmium telluride
- Quite time longitudinal and UT variation of the equatorial electrojet inferred from CHAMP satellite
- Electrical characterization of ZnO and ZnO Schottky barrier diodes
Author: Auret, F.D. (Francois Danie)
- Ohmic contacts to cadmium telluride
- Schottky barrier diode fabrication on n-GaN for altraviolet detection
- Electrical characterization of process induced defects in germanium
- Characterization of process and radiation induced defects in Si and Ge using conventional deep level transient spectroscopy (DLTS) and Laplace-DLTS
- Electrical and structural characterization of metal germanides
- Influence of particle irradiation on the electrical and defect properties of GaAs