Similar Items: Electrical characterisation of particle irradiated 4H-SiC
- Effect of swift heavy ion irradiation and annealing on the microstructure and migration behaviour of implanted Sr and Ag in SiC
- RBS investigation of the diffusion of implanted xenon in 6H-SIC
- Diffusion of ion implanted iodine in 6H-SiC
- Solid-state interactions between Zr thin films and SiC
- The solid state interaction of palladium with SiC
- The development of analytical methods for PBMR Triso SiC characterization
Author: Auret, F.D. (Francois Danie)
- Ohmic contacts to cadmium telluride
- Schottky barrier diode fabrication on n-GaN for altraviolet detection
- Electrical characterization of process induced defects in germanium
- Characterization of process and radiation induced defects in Si and Ge using conventional deep level transient spectroscopy (DLTS) and Laplace-DLTS
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- Influence of particle irradiation on the electrical and defect properties of GaAs