Similar Items: Cobalt silicides formation through a diffusion barrier
- Silicide formation through diffusion barriers
- The formation of epitaxially stabilized nickel and cobalt silicides by pulsed laser annealing
- Solid state diffusion in metal silicides
- Marker studies of nickel silicide formation
- Marker and self-diffusion studies in metal silicides using 31Si
- The effect of diffusion barriers, stress and lateral diffusion on thin-film phase formation
Author: Theron, C.C. (Chris)
- The solid state interaction of palladium with SiC
- Evaluation of velocity interferometry for high energetic materials using a VISAR
- Characterization of SANS Facility at Necsa and SANS Application to the Study of Wool Fibres
- Structural and electrical properties of annealed Ru thin films on SiC
- Solid-state interactions between Zr thin films and SiC
- Analysis of W^± bosons with ALICE: Effect of alignment on W^± bosons analysis