Similar Items: Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process
- Complementary Field Effect Transistor (CFET) for the 2-nm Technology Node: A Review From Device to Circuit Perspectives
- A Low-Power Voltage Limiter/Regulator IC in Standard Thick-Oxide 130 nm CMOS for Inductive Power Transfer Application
- A Compact 55–66 GHz Single‐Chip FMCW Transceiver Featuring 12‐dBm Psat and >11‐GHz Tuning Range in 65‐nm SOI CMOS
- Metrology and Measurement Systems | 2021 | vol. 28 | No 1
- Metrology and Measurement Systems | 2021 | vol. 28 | No 2
- Metrology and Measurement Systems | 2021 | vol. 28 | No 3