Author: Stellenbosch University. Faculty of . Dept. of
Similar Items: Aspects of electron microscopic characterisation of thin solid films
- Electron microscope characterisation of self-supporting thin solid films
- Solid state interaction between thin films of chromium and silicon
- Solid-state interaction between thin Cr, Ni and Pt films with silicon
- In situ, real-time characterization of solid-state reaction in thin films
- Chemical synthesis and electrical characterization of nickel oxide thin films for sensor applications
- The effect of diffusion barriers, stress and lateral diffusion on thin-film phase formation