APA (7th ed.) Citation
Mohamed, A. M. A. E. D. A. (2020). Testing of leakage current failure in ASIC devices exposed to total ionizing dose environment using design for testability techniques. AUC Knowledge Fountain.
Chicago Style (17th ed.) Citation
Mohamed, Assem Mohamed Alaa El Din Ali. Testing of Leakage Current Failure in ASIC Devices Exposed to Total Ionizing Dose Environment Using Design for Testability Techniques. AUC Knowledge Fountain, 2020.
MLA (9th ed.) Citation
Mohamed, Assem Mohamed Alaa El Din Ali. Testing of Leakage Current Failure in ASIC Devices Exposed to Total Ionizing Dose Environment Using Design for Testability Techniques. AUC Knowledge Fountain, 2020.
Warning: These citations may not always be 100% accurate.