APA (7th ed.) Citation
Abdelwahab, M. S. (2018). Identifying worst case test vectors for FPGA exposed to total ionization dose using design for testability techniques. AUC Knowledge Fountain.
Chicago Style (17th ed.) Citation
Abdelwahab, Mohamed Sami. Identifying Worst Case Test Vectors for FPGA Exposed to Total Ionization Dose Using Design for Testability Techniques. AUC Knowledge Fountain, 2018.
MLA (9th ed.) Citation
Abdelwahab, Mohamed Sami. Identifying Worst Case Test Vectors for FPGA Exposed to Total Ionization Dose Using Design for Testability Techniques. AUC Knowledge Fountain, 2018.
Warning: These citations may not always be 100% accurate.