Wael, M. (2022). Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment. AUC Knowledge Fountain.
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Chicago Style (17th ed.) Citation
Wael, Mohamed. Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment. AUC Knowledge Fountain, 2022.
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MLA (9th ed.) Citation
Wael, Mohamed. Single Event Transient Sensitivity Measurement and Worst-Case Test Vector Exploration for ASIC Devices Exposed to Space Single Event Environment. AUC Knowledge Fountain, 2022.
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Warning: These citations may not always be 100% accurate.