APA (7th ed.) Citation
Hemeda, M. (2023). Stochastic Worst-Case Test Vectors for ASIC Devices in Single Event Environment. AUC Knowledge Fountain.
Chicago Style (17th ed.) Citation
Hemeda, Mostafa. Stochastic Worst-Case Test Vectors for ASIC Devices in Single Event Environment. AUC Knowledge Fountain, 2023.
MLA (9th ed.) Citation
Hemeda, Mostafa. Stochastic Worst-Case Test Vectors for ASIC Devices in Single Event Environment. AUC Knowledge Fountain, 2023.
Warning: These citations may not always be 100% accurate.