Bredekamp, A. H., & Tapson, J. (2014). A scanning tunneling microscope control system with potentiometric capability. Department of Electrical Engineering.
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Chicago Style (17th ed.) Citation
Bredekamp, Adriaan H., and Jon Tapson. A Scanning Tunneling Microscope Control System with Potentiometric Capability. Department of Electrical Engineering, 2014.
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MLA (9th ed.) Citation
Bredekamp, Adriaan H., and Jon Tapson. A Scanning Tunneling Microscope Control System with Potentiometric Capability. Department of Electrical Engineering, 2014.
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Warning: These citations may not always be 100% accurate.