APA (7th ed.) Citation
Meyer, W. (2016). Electrical characterization of process- and radiation-induced defects in 4H-SiC. University of Pretoria.
Chicago Style (17th ed.) Citation
Meyer, W.E. Electrical Characterization of Process- and Radiation-induced Defects in 4H-SiC. University of Pretoria, 2016.
MLA (9th ed.) Citation
Meyer, W.E. Electrical Characterization of Process- and Radiation-induced Defects in 4H-SiC. University of Pretoria, 2016.
Warning: These citations may not always be 100% accurate.