Meyer, W. (2019). Electrical characterization of ion-beam induced damage in GaN. University of Pretoria.
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Chicago Style (17th ed.) Citation
Meyer, W.E. Electrical Characterization of Ion-beam Induced Damage in GaN. University of Pretoria, 2019.
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MLA (9th ed.) Citation
Meyer, W.E. Electrical Characterization of Ion-beam Induced Damage in GaN. University of Pretoria, 2019.
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Warning: These citations may not always be 100% accurate.