Meyer, W. (2019). Design of a stress-dependent deep-level transient spectroscopy instrument for the study of the structural properties of defects in semiconductors. University of Pretoria.
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Chicago Style (17th ed.) Citation
Meyer, W.E. Design of a Stress-dependent Deep-level Transient Spectroscopy Instrument for the Study of the Structural Properties of Defects in Semiconductors. University of Pretoria, 2019.
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MLA (9th ed.) Citation
Meyer, W.E. Design of a Stress-dependent Deep-level Transient Spectroscopy Instrument for the Study of the Structural Properties of Defects in Semiconductors. University of Pretoria, 2019.
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Warning: These citations may not always be 100% accurate.