Skip to content

Home Search Guides Journals Learning

FRELIP Discovery Search

Open Access Catalog for African Scholarship

Electrical characterization of...
Text This

Text this: Electrical characterization of process induced defects in GaAs by Laplace deep level transient spectroscopy

Number:

Provider:

About FRELIP

Free eLibrary Portal (FRELIP) provides access to academic resources, research materials, and scholarly publications from African universities and global repositories.

Quick Links

FRELIP Home
About FRELIP
Research Guides
Search Catalog
Learning Platform
Course Catalogue

Resources

Indexed Records: 130,000+
Disciplines: 18
Subjects: 155

FRELIP is the leading open-access discovery platform — born in Nigeria, built for African scholarship, serving the world.

© 2026 FRELIP - Free eLibrary Portal | frelip.org | Powered by VuFind

Follow FRELIP