Meyer, W. (2020). Investigation of electron-beam deposition and related damage in p-Si by means of Laplace and conventional deep-level transient spectroscopy. University of Pretoria.
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Chicago Style (17th ed.) Citation
Meyer, W.E. Investigation of Electron-beam Deposition and Related Damage in P-Si by Means of Laplace and Conventional Deep-level Transient Spectroscopy. University of Pretoria, 2020.
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MLA (9th ed.) Citation
Meyer, W.E. Investigation of Electron-beam Deposition and Related Damage in P-Si by Means of Laplace and Conventional Deep-level Transient Spectroscopy. University of Pretoria, 2020.
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Warning: These citations may not always be 100% accurate.