Auret, F. (2024). Electrical characterisation of plasma processing induced defects in silicon. University of Pretoria.
Successfully copied to clipboard
Copying to clipboard failed
Chicago Style (17th ed.) Citation
Auret, F.D. Electrical Characterisation of Plasma Processing Induced Defects in Silicon. University of Pretoria, 2024.
Successfully copied to clipboard
Copying to clipboard failed
MLA (9th ed.) Citation
Auret, F.D. Electrical Characterisation of Plasma Processing Induced Defects in Silicon. University of Pretoria, 2024.
Successfully copied to clipboard
Copying to clipboard failed
Warning: These citations may not always be 100% accurate.