Sciocatti, V. J., & Barnard, A. (2021). Developing a test suite to aid in single event effect testing of ARM microcontrollers. Stellenbosch : Stellenbosch University.
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Chicago Style (17th ed.) Citation
Sciocatti, Victor J., and Arno Barnard. Developing a Test Suite to Aid in Single Event Effect Testing of ARM Microcontrollers. Stellenbosch : Stellenbosch University, 2021.
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MLA (9th ed.) Citation
Sciocatti, Victor J., and Arno Barnard. Developing a Test Suite to Aid in Single Event Effect Testing of ARM Microcontrollers. Stellenbosch : Stellenbosch University, 2021.
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Warning: These citations may not always be 100% accurate.