APA (7th ed.) Citation
Smit, J., & Burger, L. E. (2025). On-edge assembly defect detection in noisy environments using convolutional neural networks. Stellenbosch : Stellenbosch University.
Chicago Style (17th ed.) Citation
Smit, Janre, and Leon E. Burger. On-edge Assembly Defect Detection in Noisy Environments Using Convolutional Neural Networks. Stellenbosch : Stellenbosch University, 2025.
MLA (9th ed.) Citation
Smit, Janre, and Leon E. Burger. On-edge Assembly Defect Detection in Noisy Environments Using Convolutional Neural Networks. Stellenbosch : Stellenbosch University, 2025.
Warning: These citations may not always be 100% accurate.