APA (7th ed.) Citation
Mocke, J. J., & Louw, L. (2026). Leveraging Retrieval-Augmented Generation, Prompt Engineering, and Vision Language Models for Surface Defect Classification and Root Cause Analysis in Manufacturing. Stellenbosch : Stellenbosch University.
Chicago Style (17th ed.) Citation
Mocke, Johannes Jacobus, and Louis Louw. Leveraging Retrieval-Augmented Generation, Prompt Engineering, and Vision Language Models for Surface Defect Classification and Root Cause Analysis in Manufacturing. Stellenbosch : Stellenbosch University, 2026.
MLA (9th ed.) Citation
Mocke, Johannes Jacobus, and Louis Louw. Leveraging Retrieval-Augmented Generation, Prompt Engineering, and Vision Language Models for Surface Defect Classification and Root Cause Analysis in Manufacturing. Stellenbosch : Stellenbosch University, 2026.
Warning: These citations may not always be 100% accurate.