Berner, H., & Blanckenberg, M. M. (2012). The selection and single event upset testing of a DSP processor for a LEO satellite. Stellenbosch : Stellenbosch University.
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Chicago Style (17th ed.) Citation
Berner, Heiko, and M. M. Blanckenberg. The Selection and Single Event Upset Testing of a DSP Processor for a LEO Satellite. Stellenbosch : Stellenbosch University, 2012.
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MLA (9th ed.) Citation
Berner, Heiko, and M. M. Blanckenberg. The Selection and Single Event Upset Testing of a DSP Processor for a LEO Satellite. Stellenbosch : Stellenbosch University, 2012.
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Warning: These citations may not always be 100% accurate.