Wagener, D. W., & Herbst, B. M. (2012). Feature tracking and pattern registration. Stellenbosch : Stellenbosch University.
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Chicago Style (17th ed.) Citation
Wagener, Dirk Wolfram, and B. M. Herbst. Feature Tracking and Pattern Registration. Stellenbosch : Stellenbosch University, 2012.
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MLA (9th ed.) Citation
Wagener, Dirk Wolfram, and B. M. Herbst. Feature Tracking and Pattern Registration. Stellenbosch : Stellenbosch University, 2012.
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Warning: These citations may not always be 100% accurate.