(2026). Analysis of Single Event Transient in SOI GaN-Based FinFET Due to Heavy-Ion Irradiation. IEEE Access.
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Chicago Style (17th ed.) Citation
"Analysis of Single Event Transient in SOI GaN-Based FinFET Due to Heavy-Ion Irradiation."
IEEE Access 2026.
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MLA (9th ed.) Citation
"Analysis of Single Event Transient in SOI GaN-Based FinFET Due to Heavy-Ion Irradiation."
IEEE Access, 2026.
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Warning: These citations may not always be 100% accurate.