(2026). Performance Analysis of L-Shaped Cladding Layer-Based Dopingless TFET Including Interface Trap Charges and Temperatures. IEEE Access.
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Chicago Style (17th ed.) Citation
"Performance Analysis of L-Shaped Cladding Layer-Based Dopingless TFET Including Interface Trap Charges and Temperatures."
IEEE Access 2026.
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MLA (9th ed.) Citation
"Performance Analysis of L-Shaped Cladding Layer-Based Dopingless TFET Including Interface Trap Charges and Temperatures."
IEEE Access, 2026.
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Warning: These citations may not always be 100% accurate.