(2026). Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature. IEEE Journal of the Electron Devices Society.
Successfully copied to clipboard
Copying to clipboard failed
Chicago Style (17th ed.) Citation
"Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature."
IEEE Journal of the Electron Devices Society 2026.
Successfully copied to clipboard
Copying to clipboard failed
MLA (9th ed.) Citation
"Experimental Verification and Analytical Modeling of the Zero Temperature Coefficient in Half-Diamond and Diamond MOSFETs Under High-Temperature."
IEEE Journal of the Electron Devices Society, 2026.
Successfully copied to clipboard
Copying to clipboard failed
Warning: These citations may not always be 100% accurate.