APA (7th ed.) Citation
(2026). A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention. PLOS ONE.
Chicago Style (17th ed.) Citation
"A Hybrid System for Detecting Semiconductor Wafer Defects Using Modified MobileNet with Multi-head Attention." PLOS ONE 2026.
MLA (9th ed.) Citation
"A Hybrid System for Detecting Semiconductor Wafer Defects Using Modified MobileNet with Multi-head Attention." PLOS ONE, 2026.
Warning: These citations may not always be 100% accurate.