(2024). In situ reflection electron microscopy for the surface processes analysis during sublimation and epitaxial growth of layered metal chalcogenides. Modern Electronic Materials.
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Chicago Style (17th ed.) Citation
"In Situ Reflection Electron Microscopy for the Surface Processes Analysis During Sublimation and Epitaxial Growth of Layered Metal Chalcogenides."
Modern Electronic Materials 2024.
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MLA (9th ed.) Citation
"In Situ Reflection Electron Microscopy for the Surface Processes Analysis During Sublimation and Epitaxial Growth of Layered Metal Chalcogenides."
Modern Electronic Materials, 2024.
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Warning: These citations may not always be 100% accurate.