(2024). Passivation of substrates with hydrogen to reduce the number of electron traps in the buffer layer at the contact of silicon with Ba1-xSrxTiO3. Modern Electronic Materials.
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Chicago Style (17th ed.) Citation
"Passivation of Substrates with Hydrogen to Reduce the Number of Electron Traps in the Buffer Layer at the Contact of Silicon with Ba1-xSrxTiO3."
Modern Electronic Materials 2024.
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MLA (9th ed.) Citation
"Passivation of Substrates with Hydrogen to Reduce the Number of Electron Traps in the Buffer Layer at the Contact of Silicon with Ba1-xSrxTiO3."
Modern Electronic Materials, 2024.
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Warning: These citations may not always be 100% accurate.