(2022). Application of X-ray diffraction and reflectometry methods for analysis of damaged layers on polar faces of ZnO after surface chemical-mechanical treatment. Modern Electronic Materials.
Successfully copied to clipboard
Copying to clipboard failed
Chicago Style (17th ed.) Citation
"Application of X-ray Diffraction and Reflectometry Methods for Analysis of Damaged Layers on Polar Faces of ZnO After Surface Chemical-mechanical Treatment."
Modern Electronic Materials 2022.
Successfully copied to clipboard
Copying to clipboard failed
MLA (9th ed.) Citation
"Application of X-ray Diffraction and Reflectometry Methods for Analysis of Damaged Layers on Polar Faces of ZnO After Surface Chemical-mechanical Treatment."
Modern Electronic Materials, 2022.
Successfully copied to clipboard
Copying to clipboard failed
Warning: These citations may not always be 100% accurate.