APA (7th ed.) Citation
(2026). Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress. IEEE Journal of the Electron Devices Society.
Chicago Style (17th ed.) Citation
"Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress." IEEE Journal of the Electron Devices Society 2026.
MLA (9th ed.) Citation
"Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress." IEEE Journal of the Electron Devices Society, 2026.
Warning: These citations may not always be 100% accurate.