(2026). Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method. IEEE Journal of the Electron Devices Society.
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Chicago Style (17th ed.) Citation
"Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method."
IEEE Journal of the Electron Devices Society 2026.
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MLA (9th ed.) Citation
"Evaluation of Interface Traps Within Drift Region in LDMOS Using a Multi-Pulse Test Method."
IEEE Journal of the Electron Devices Society, 2026.
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