APA (7th ed.) Citation
(2026). Measurement and Analysis of Multistate Ferroelectric Transistors in 28 nm CMOS Process. IEEE Journal of the Electron Devices Society.
Chicago Style (17th ed.) Citation
"Measurement and Analysis of Multistate Ferroelectric Transistors in 28 Nm CMOS Process." IEEE Journal of the Electron Devices Society 2026.
MLA (9th ed.) Citation
"Measurement and Analysis of Multistate Ferroelectric Transistors in 28 Nm CMOS Process." IEEE Journal of the Electron Devices Society, 2026.
Warning: These citations may not always be 100% accurate.