(2026). Patterns and Predictors of Student Technological Proficiency in Heis: A Validated Instrument and Machine Learning Analysis. International Journal of Modern Education and Computer Science.
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Chicago Style (17th ed.) Citation
"Patterns and Predictors of Student Technological Proficiency in Heis: A Validated Instrument and Machine Learning Analysis."
International Journal of Modern Education and Computer Science 2026.
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MLA (9th ed.) Citation
"Patterns and Predictors of Student Technological Proficiency in Heis: A Validated Instrument and Machine Learning Analysis."
International Journal of Modern Education and Computer Science, 2026.
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Warning: These citations may not always be 100% accurate.