(2026). Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization. Advanced Intelligent Systems.
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Chicago Style (17th ed.) Citation
"Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization."
Advanced Intelligent Systems 2026.
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MLA (9th ed.) Citation
"Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization."
Advanced Intelligent Systems, 2026.
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Warning: These citations may not always be 100% accurate.