APA (7th ed.) Citation
(2026). Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation. IEEE Access.
Chicago Style (17th ed.) Citation
"Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation." IEEE Access 2026.
MLA (9th ed.) Citation
"Efficient Micro-LED Defect Detection Using a Pruned YOLO With CBAM and Class-Oriented Replacement Augmentation." IEEE Access, 2026.
Warning: These citations may not always be 100% accurate.