Full Text Available
Access Full Text at Repository
Search Results - Electronics Engineering
-
Hybrid FEA‐ML Optimization of Passive Low‐Frequency Shields With Eccentric Conductors
Published in Electronics Letters (2026)Subjects: “…Electronics…”
Get full text
Online Article RSS Article -
Piezoelectric Ceramic Resonator for Physical Reservoir Computing
Published in Electronics Letters (2026)Subjects: “…Electronics…”
Get full text
-
Behavioural Modelling and Verification of a Novel Weighted System‐Level Chopping for High‐Resolution Incremental ADCs
Published in Electronics Letters (2026)Subjects: “…Electronics…”
Get full text
-
Deep‐Learned Channel Estimation for MIMO‐OFDM System by Exploiting Frequency‐Space Correlation
Published in Electronics Letters (2025)Subjects: “…Electronics…”
Get full text
-
A Novel Lightweight and High‐Performance Detection Framework for Signal Detection in Wideband Spectrogram
Published in Electronics Letters (2025)Subjects: “…Electronics…”
Get full text
-
Collaborative Beamforming for Multi‐Target Localization Using Passive Anchors
Published in Electronics Letters (2025)Subjects: “…Electronics…”
Get full text
-
Abnormal Power Usage Detection: A Metrics‐Based Scheme for Low Sampling Data
Published in Electronics Letters (2025)Subjects: “…Electronics…”
Get full text
-
Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights
Published in IEEE Journal of the Electron Devices Society (2025)Subjects: “…Electronics…”
Get full text
-
Development and Evaluation of SiC LDMOS for High-Temperature Applications
Published in IEEE Journal of the Electron Devices Society (2025)Subjects: “…Electronics…”
Get full text
-
A Cryogenic Ultra-Thin Body SiGeSn Transistor
Published in IEEE Journal of the Electron Devices Society (2025)Subjects: “…Electronics…”
Get full text
-
Dynamic Evolution of Hydrogen in IGZO Transistors for PBTI Improvement by Low-Temperature Atmosphere Annealing
Published in IEEE Journal of the Electron Devices Society (2025)Subjects: “…Electronics…”
Get full text
-
Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis
Published in IEEE Journal of the Electron Devices Society (2026)Subjects: “…Electronics…”
Get full text
-
Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks
Published in IEEE Journal of the Electron Devices Society (2026)Subjects: “…Electronics…”
Get full text
-
Complementary Field Effect Transistor (CFET) for the 2-nm Technology Node: A Review From Device to Circuit Perspectives
Published in IEEE Journal of the Electron Devices Society (2025)Subjects: “…Electronics…”
Get full text
-
Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress
Published in IEEE Journal of the Electron Devices Society (2026)Subjects: “…Electronics…”
Get full text
-
Monolithic Comparators on a Novel Platform of GaN-Based D/E-Mode HEMTs by LPCVD SiNx Passivation Compatible to Gate Dielectrics
Published in IEEE Journal of the Electron Devices Society (2026)Subjects: “…Electronics…”
Get full text
-
Microchannel Cooling for Performance Enhancement of GaN-on-Si HEMT With a Low Rj-a of 13.5 K/W
Published in IEEE Journal of the Electron Devices Society (2026)Subjects: “…Electronics…”
Get full text
-
Simulation Study on the Scalability of Channel-All-Around Reconfigurable Field-Effect Transistors With Gate-Controlled Polarity
Published in IEEE Journal of the Electron Devices Society (2026)Subjects: “…Electronics…”
Get full text