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  1. Cover Image

    Beyond Fixed Waveforms: Adaptive Angle‐Dependent Design for Next‐Generation 3D Radar Systems

    Published in Electronics Letters (2026)
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    Stereoscopic Saliency Detection for Rail Surface Defects via Global Low‐Rank Reconstruction and Depth Outlier Fusion

    Published in Electronics Letters (2026)
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    Correction to “Revised Dingo Optimization Algorithm for Frequency Offset Design in FDA‐MIMO Radar”

    Published in Electronics Letters (2026)
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    A Compact 55–66 GHz Single‐Chip FMCW Transceiver Featuring 12‐dBm Psat and >11‐GHz Tuning Range in 65‐nm SOI CMOS

    Published in Electronics Letters (2026)
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    High‐Linearity Remapping Scan With Genetic Algorithm for Digital Micro‐Displays

    Published in Electronics Letters (2026)
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    Three‐Dimensional Path Planning for Unmanned Aerial Vehicle Based on Multi‐Strategy Improved Dung Beetle Optimisation Algorithm

    Published in Electronics Letters (2026)
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    MiRA: Multi‐Granularity Consensus Representation Alignment for Unsupervised Cross‐Modal Retrieval

    Published in Electronics Letters (2026)
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    Parameter‐Efficient Adaptation of GPT‐Style Foundation Models for Power Grid Load Forecasting

    Published in Electronics Letters (2026)
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    Robust Radar Tracking via Joint Adaptive EKF and Power Allocation Under Dynamic Clutter

    Published in Electronics Letters (2026)
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  10. Cover Image

    IEEE ELECTRON DEVICES SOCIETY

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    Reliability of AlScN/GaN HEMTs Under Pulsed Measurements and HTRB Step-Stress Tests: Experimental and TCAD Insights

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  12. Cover Image

    Development and Evaluation of SiC LDMOS for High-Temperature Applications

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    Direct Extraction of Fowler–Nordheim Tunneling Parameters of Asymmetric Metal-Insulator-Metal Diodes Based on Current-Voltage Measurement

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  14. Cover Image

    A Cryogenic Ultra-Thin Body SiGeSn Transistor

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    Dynamic Evolution of Hydrogen in IGZO Transistors for PBTI Improvement by Low-Temperature Atmosphere Annealing

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    Investigation of PBTS-Induced Degradation Mechanisms in SA TG Coplanar IGZO TFTs Using Low-Frequency Noise Analysis

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    Repetitive Gate-HBM-ESD-Induced Vth Degradation for RF GaN HEMT With Matching Networks

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    Enhancing Ultraviolet Responsivity of GaN p-i-n Photodetectors Through Full Depletion Thin-Layer Doping-Induced Carrier Transport Modulation

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    Complementary Field Effect Transistor (CFET) for the 2-nm Technology Node: A Review From Device to Circuit Perspectives

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    Research on Degradation of P-FinFET Under Mixed NBTI and HCD Stress

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