Similar Items: Electrical characterization of semiconductor heterostructures
- Electrical characterisation of particle irradiated 4H-SiC
- Optical characterization of semiconductors using photo reflection spectroscopy
- Surface engineering studies using argon ion bombardment of compound semiconductors including photovoltaic semiconductors
- Investigation of the diffusion behaviour of aliminium in different semiconductors
- A near infrared femtosecond laser source for observation of charge transfer processes in semiconductors
- Two dimensional quantum and reliability modelling for lightly doped nanoscale devices
Author: Auret, F.D. (Francois Danie)
- Ohmic contacts to cadmium telluride
- Schottky barrier diode fabrication on n-GaN for altraviolet detection
- Electrical characterization of process induced defects in germanium
- Characterization of process and radiation induced defects in Si and Ge using conventional deep level transient spectroscopy (DLTS) and Laplace-DLTS
- Electrical and structural characterization of metal germanides
- Influence of particle irradiation on the electrical and defect properties of GaAs