Mohamed, A. (2021). Fault Modeling and Test Vector Generation for ASIC Devices Exposed to Space Single Event Environment. AUC Knowledge Fountain.
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Chicago Style (17th ed.) Citation
Mohamed, Ahmed. Fault Modeling and Test Vector Generation for ASIC Devices Exposed to Space Single Event Environment. AUC Knowledge Fountain, 2021.
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MLA (9th ed.) Citation
Mohamed, Ahmed. Fault Modeling and Test Vector Generation for ASIC Devices Exposed to Space Single Event Environment. AUC Knowledge Fountain, 2021.
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Warning: These citations may not always be 100% accurate.