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Enhanced Data Sampling and Feature Generation for Machine Learning-based Lithography Hotspot Detection

Technology scaling has increased the complexity of integrated circuit design. It has also led to more challenges in the field of Design for Manufacturing (DFM). One of these challenges is lithography hotspot detection. Hotspots (HS) are design patterns that negatively affect the output yield. Identi...

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Main Author: Ismail, Mohamed
Format: Thesis
Published: AUC Knowledge Fountain 2022
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access_status_str Open Access
author Ismail, Mohamed
author_browse Ismail, Mohamed
author_facet Ismail, Mohamed
author_sort Ismail, Mohamed
collection Thesis
description Technology scaling has increased the complexity of integrated circuit design. It has also led to more challenges in the field of Design for Manufacturing (DFM). One of these challenges is lithography hotspot detection. Hotspots (HS) are design patterns that negatively affect the output yield. Identifying these patterns early in the design phase is crucial for high yield fabrication. Machine Learning-based (ML) hotspot detection techniques are promising since they have shown superior results to other methods such as pattern matching. Training ML models is a challenging task due two main reasons. Firstly, industrial training designs contain millions of unique patterns. It is impractical to train models using this large number of patterns due to limited computational and memory resources. Secondly, the HS detection problem has an imbalanced nature; datasets typically have a limited number of HS and a large number of nonhotspots. This requires the use of data sampling techniques to choose the best representative dataset for training. In this thesis, we explore the problem of hotspot detection using machine learning. Specifically, we tackle the problem of data sampling where we introduce a method for dataset selection that enables the reduction of the training dataset size and improves the data balance between hotspot and non-hotspot patterns. In addition, we explore feature engineering using image gradients as a method of improving ML HS detection models.
format Thesis
id oai:fount.aucegypt.edu:etds-2934
institution American University in Cairo (Egypt)
last_indexed 2026-06-10T12:35:53.165Z
license_str Not specified — see source repository
provenance_str_mv Harvested via OAI-PMH from AUC Knowledge Fountain — bepress
publishDate 2022
publishDateRange 2022
publishDateSort 2022
publisher AUC Knowledge Fountain
publisherStr AUC Knowledge Fountain
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source_str AUC Knowledge Fountain — bepress
spelling oai:fount.aucegypt.edu:etds-2934 Enhanced Data Sampling and Feature Generation for Machine Learning-based Lithography Hotspot Detection Ismail, Mohamed Technology scaling has increased the complexity of integrated circuit design. It has also led to more challenges in the field of Design for Manufacturing (DFM). One of these challenges is lithography hotspot detection. Hotspots (HS) are design patterns that negatively affect the output yield. Identifying these patterns early in the design phase is crucial for high yield fabrication. Machine Learning-based (ML) hotspot detection techniques are promising since they have shown superior results to other methods such as pattern matching. Training ML models is a challenging task due two main reasons. Firstly, industrial training designs contain millions of unique patterns. It is impractical to train models using this large number of patterns due to limited computational and memory resources. Secondly, the HS detection problem has an imbalanced nature; datasets typically have a limited number of HS and a large number of nonhotspots. This requires the use of data sampling techniques to choose the best representative dataset for training. In this thesis, we explore the problem of hotspot detection using machine learning. Specifically, we tackle the problem of data sampling where we introduce a method for dataset selection that enables the reduction of the training dataset size and improves the data balance between hotspot and non-hotspot patterns. In addition, we explore feature engineering using image gradients as a method of improving ML HS detection models. 2022-06-15T07:00:00Z thesis application/pdf https://fount.aucegypt.edu/etds/1906 https://fount.aucegypt.edu/context/etds/article/2934/viewcontent/mohamed_tarek_ismail_thesis.pdf Theses and Dissertations AUC Knowledge Fountain autoencoder clustering DBSCAN data reduction design for manufacturing hotspots machine learning sampling
spellingShingle autoencoder
clustering
DBSCAN
data reduction
design for manufacturing
hotspots
machine learning
sampling
Ismail, Mohamed
Enhanced Data Sampling and Feature Generation for Machine Learning-based Lithography Hotspot Detection
title Enhanced Data Sampling and Feature Generation for Machine Learning-based Lithography Hotspot Detection
title_full Enhanced Data Sampling and Feature Generation for Machine Learning-based Lithography Hotspot Detection
title_fullStr Enhanced Data Sampling and Feature Generation for Machine Learning-based Lithography Hotspot Detection
title_full_unstemmed Enhanced Data Sampling and Feature Generation for Machine Learning-based Lithography Hotspot Detection
title_short Enhanced Data Sampling and Feature Generation for Machine Learning-based Lithography Hotspot Detection
title_sort enhanced data sampling and feature generation for machine learning based lithography hotspot detection
topic autoencoder
clustering
DBSCAN
data reduction
design for manufacturing
hotspots
machine learning
sampling
url https://fount.aucegypt.edu/etds/1906
https://fount.aucegypt.edu/context/etds/article/2934/viewcontent/mohamed_tarek_ismail_thesis.pdf
work_keys_str_mv AT ismailmohamed enhanceddatasamplingandfeaturegenerationformachinelearningbasedlithographyhotspotdetection