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Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy
Includes abstract.
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| Main Author: | |
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| Other Authors: | |
| Format: | Thesis |
| Language: | English |
| Published: |
Department of Physics
2015
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| _version_ | 1867613548012634112 |
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| access_status_str | Open Access |
| author | Unuigbe, David Moweme |
| author2 | Britton, David T |
| author_browse | Britton, David T Unuigbe, David Moweme |
| author_facet | Britton, David T Unuigbe, David Moweme |
| author_sort | Unuigbe, David Moweme |
| collection | Thesis |
| description | Includes abstract. |
| format | Thesis |
| id | oai:open.uct.ac.za:11427/12105 |
| institution | University of Cape Town (South Africa) |
| language | eng |
| last_indexed | 2026-06-10T12:37:53.712Z |
| license_str | Not specified — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from UCTD — University of Cape Town Open Access Repository |
| publishDate | 2015 |
| publishDateRange | 2015 |
| publishDateSort | 2015 |
| publisher | Department of Physics |
| publisherStr | Department of Physics |
| record_format | dspace |
| source_str | UCTD — University of Cape Town Open Access Repository |
| spelling | oai:open.uct.ac.za:11427/12105 Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy Unuigbe, David Moweme Britton, David T Härting, Margit Physics Includes abstract. Includes bibliographical references. The establishment of printing technologies, using nanoparticle based inks, promises inexpensive manufacture of electronic devices. However, to produce working devices, nanoparticles have to meet requirements on size, shape, and composition. In the application of silicon nanoparticles in electronics, it is important that a network of interconnecting particles is formed through which charge transport can take place. Of further importance is that there is an absence of surface oxide in order to maintain a direct silicon-silicon connection within the network. In this work, cheap and scalable production of silicon nanoparticles is achieved efficiently with a top-down process of mechanical attrition by high energy milling. 2015-01-11T13:32:44Z 2015-01-11T13:32:44Z 2012 Master Thesis Masters MSc http://hdl.handle.net/11427/12105 eng application/pdf Department of Physics Faculty of Science University of Cape Town |
| spellingShingle | Physics Unuigbe, David Moweme Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy |
| thesis_degree_str | Master's |
| title | Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy |
| title_full | Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy |
| title_fullStr | Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy |
| title_full_unstemmed | Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy |
| title_short | Characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy, energy dispersive X-ray spectroscopy and X-ray photoemission spectroscopy |
| title_sort | characterisation of silicon nanoparticles produced by mechanical attrition using scanning electron microscopy energy dispersive x ray spectroscopy and x ray photoemission spectroscopy |
| topic | Physics |
| url | http://hdl.handle.net/11427/12105 |
| work_keys_str_mv | AT unuigbedavidmoweme characterisationofsiliconnanoparticlesproducedbymechanicalattritionusingscanningelectronmicroscopyenergydispersivexrayspectroscopyandxrayphotoemissionspectroscopy |