Full Text Available

Note: Clicking the button above will open the full text document at the original institutional repository in a new window.

Tomographic reconstruction of the morphology of silicon nanoparticleclusters

Includes bibliographical references.

Saved in:
Bibliographic Details
Main Author: Jones, Stephen David
Other Authors: Härting, Margit
Format: Thesis
Language:English
Published: Department of Physics 2015
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!
_version_ 1867613447282229249
access_status_str Open Access
author Jones, Stephen David
author2 Härting, Margit
author_browse Härting, Margit
Jones, Stephen David
author_facet Härting, Margit
Jones, Stephen David
author_sort Jones, Stephen David
collection Thesis
description Includes bibliographical references.
format Thesis
id oai:open.uct.ac.za:11427/12933
institution University of Cape Town (South Africa)
language eng
last_indexed 2026-06-10T12:36:17.648Z
license_str Not specified — see source repository
provenance_str_mv Harvested via OAI-PMH from UCTD — University of Cape Town Open Access Repository
publishDate 2015
publishDateRange 2015
publishDateSort 2015
publisher Department of Physics
publisherStr Department of Physics
record_format dspace
source_str UCTD — University of Cape Town Open Access Repository
spelling oai:open.uct.ac.za:11427/12933 Tomographic reconstruction of the morphology of silicon nanoparticleclusters Jones, Stephen David Härting, Margit Britton, David T Physics Includes bibliographical references. Semiconducting silicon nanoparticles and nanoparticle clusters are studied using conventional TEM, high resolution TEM and transmission electron tomography techniques. TEM and TEM based tomography provide the means to determine the size and morphology of primary particles and clusters, while the structure of printed macroscopic layers has previously been characterised via small angle X-ray scattering (SAXS). High resolution TEM studies were also carried out on the nanoparticles at high magnification in order to examine the internal structure of the nanoparticles, which is found to contain both ordered as well as amorphous regions. As the nanoparticle clusters studied in this work are tightly bound, dense structures, traditional alignment techniques do not produce satisfactory alignment of the micrographs from which the tomograms are reconstructed, resulting in reconstructions which possess significant artifacts. This limitation is overcome by the development of a new correlation based alignment technique which produces superior alignment when compared to previous techniques, especially in the case of dense samples. The resulting alignment has allowed for the reconstruction of tomograms from which morphological information of the nanoparticle clusters is inferred. The clusters are found to be tightly bound hierarchical clusters, consisting of a large central core surrounded by smaller particles, whose surfaces are faceted. The morphological information gained from the tomography studies has been combined with the macroscopic structure of the layers to infer the arrangement of the nanoparticle clusters within the particle network of the printed layers. 2015-05-27T04:12:16Z 2015-05-27T04:12:16Z 2014 Doctoral Thesis Doctoral PhD http://hdl.handle.net/11427/12933 eng application/pdf Department of Physics Faculty of Science University of Cape Town
spellingShingle Physics
Jones, Stephen David
Tomographic reconstruction of the morphology of silicon nanoparticleclusters
thesis_degree_str Doctoral
title Tomographic reconstruction of the morphology of silicon nanoparticleclusters
title_full Tomographic reconstruction of the morphology of silicon nanoparticleclusters
title_fullStr Tomographic reconstruction of the morphology of silicon nanoparticleclusters
title_full_unstemmed Tomographic reconstruction of the morphology of silicon nanoparticleclusters
title_short Tomographic reconstruction of the morphology of silicon nanoparticleclusters
title_sort tomographic reconstruction of the morphology of silicon nanoparticleclusters
topic Physics
url http://hdl.handle.net/11427/12933
work_keys_str_mv AT jonesstephendavid tomographicreconstructionofthemorphologyofsiliconnanoparticleclusters