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The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques

Bibliography: pages 128-129.

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Main Author: Padayachee, Jayanethie
Other Authors: Prozesky, Victor M
Format: Thesis
Language:English
Published: Department of Physics 2016
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access_status_str Open Access
author Padayachee, Jayanethie
author2 Prozesky, Victor M
author_browse Padayachee, Jayanethie
Prozesky, Victor M
author_facet Prozesky, Victor M
Padayachee, Jayanethie
author_sort Padayachee, Jayanethie
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description Bibliography: pages 128-129.
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institution University of Cape Town (South Africa)
language eng
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license_str Not specified — see source repository
provenance_str_mv Harvested via OAI-PMH from UCTD — University of Cape Town Open Access Repository
publishDate 2016
publishDateRange 2016
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publisher Department of Physics
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spelling oai:open.uct.ac.za:11427/16143 The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques Padayachee, Jayanethie Prozesky, Victor M Britton, David T Physics Bibliography: pages 128-129. The elimination of some blurring property, such as the detector response function, from spectra has received a considerable amount of attention. The problem is usually complicated by the presence of noise in the data, and in general, there exists an infinite set of possible solutions which are consistent with the data within the bounds imposed by the noise. Such a problem is known, generally, as an ill-defined inverse problem. Many techniques have been developed in an attempt to solve inverse problems, for example the problem of deconvolution, but these techniques employ ad hoc modifications to solve different problems. Bayesian Statistics has been proved to be the only consistent method for solving inverse problems of the type where the information is expressed in terms of probability distributions. This dissertation presents results of applying the Bayesian formalism, together with the concepts of maximum information entropy and multiresolution pixons, to various inverse problems in ion beam analysis; The results of this method of deconvoluting Rutherford Backscattering Spectrometry (RBS) and Proton Induced X-ray Emission (PIXE) spectra are compared to the results from other deconvolution techniques, namely Fourier Transforms, Jansson's method and maximum entropy (MaxEnt) without pixons. All the deconvolution techniques show an improvement in the resolution of the RBS spectra but only the MaxEnt techniques show a significant improvement in the resolution of the PIXE spectra. The MaxEnt methods also produce physically acceptable results. The MaxEnt formalism was applied to the extraction of depth profiles from RBS and PIXE spectra and yielded good results. The technique was also used to deconvolute the beam profile from one-dimensional nuclear microprobe scans. 2016-01-02T04:53:02Z 2016-01-02T04:53:02Z 1997 Master Thesis Masters MSc http://hdl.handle.net/11427/16143 eng application/pdf Department of Physics Faculty of Science University of Cape Town
spellingShingle Physics
Padayachee, Jayanethie
The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques
thesis_degree_str Master's
title The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques
title_full The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques
title_fullStr The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques
title_full_unstemmed The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques
title_short The application of Bayesian statistics and maximum entropy to Ion beam analysis techniques
title_sort application of bayesian statistics and maximum entropy to ion beam analysis techniques
topic Physics
url http://hdl.handle.net/11427/16143
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