Full Text Available
Note: Clicking the button above will open the full text document at the original institutional repository in a new window.
Characterizing Single Event Upsets within the lpGBT-based End-of-Substructure Card
The CERN ATLAS particle physics experiment is currently undergoing a significant system upgrade (ATLAS Phase II upgrade). As a result of the upgrade the experiment's Inner Tracker (ITk) and the front-end electronics of the ITk are being redesigned to handle increased data rates and a higher radiatio...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | English |
| Published: |
Department of Electrical Engineering
2022
|
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|
Similar Items: Characterizing Single Event Upsets within the lpGBT-based End-of-Substructure Card
- Investigating the Optical Link Performance of the End-of Substructure Card and Susceptibility to SEUs
- The selection and single event upset testing of a DSP processor for a LEO satellite
- The use of ground penetrating radar for track substructure characterization
- An End-to-End Deep Learning Architecture for Information Extraction from Turkish Identity Cards
- Detecting suspicious persons in multiple-choice tests: Comparison of performance of 𝜔 and GBT indexes
- Automatic upset recovery for small fixed-wing UAVs