Full Text Available
Note: Clicking the button above will open the full text document at the original institutional repository in a new window.
Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction
Resistance thermometers are often made of thin, sputter-deposited platinum layers on a corundum substrate. Since such thermometers are usually exposed to extreme temperatures, residual stress is building up at the Pt-Ah03 interface and can possibly damage the layer. Therefore, the stress in the laye...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis |
| Language: | English |
| Published: |
Department of Physics
2023
|
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|
| _version_ | 1867613296875536384 |
|---|---|
| access_status_str | Open Access |
| author | Bollhofer, Axel |
| author2 | Härting, Margit |
| author_browse | Bollhofer, Axel Härting, Margit |
| author_facet | Härting, Margit Bollhofer, Axel |
| author_sort | Bollhofer, Axel |
| collection | Thesis |
| description | Resistance thermometers are often made of thin, sputter-deposited platinum layers on a corundum substrate. Since such thermometers are usually exposed to extreme temperatures, residual stress is building up at the Pt-Ah03 interface and can possibly damage the layer. Therefore, the stress in the layer is measured by means of non-destructive x-ray diffraction and evaluated by the frequently used "d-sin21/J" method. The apparatus for the measurements was a Q-goniometer with a Bragg-Brentano focusing beam arrangement and a position sensitive detector. X-ray fluorescence scans were also performed on the sample in order to gain information about its composition. Additionally, a scanning-electron-microscope was used to investigate its microstructure. The crystallographic texture of the platinum was also examined by x-ray diffraction and displayed in pole figures. |
| format | Thesis |
| id | oai:open.uct.ac.za:11427/38444 |
| institution | University of Cape Town (South Africa) |
| language | eng |
| last_indexed | 2026-06-10T12:33:54.099Z |
| license_str | Not specified — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from UCTD — University of Cape Town Open Access Repository |
| publishDate | 2023 |
| publishDateRange | 2023 |
| publishDateSort | 2023 |
| publisher | Department of Physics |
| publisherStr | Department of Physics |
| record_format | dspace |
| source_str | UCTD — University of Cape Town Open Access Repository |
| spelling | oai:open.uct.ac.za:11427/38444 Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction Bollhofer, Axel Härting, Margit Physics Resistance thermometers are often made of thin, sputter-deposited platinum layers on a corundum substrate. Since such thermometers are usually exposed to extreme temperatures, residual stress is building up at the Pt-Ah03 interface and can possibly damage the layer. Therefore, the stress in the layer is measured by means of non-destructive x-ray diffraction and evaluated by the frequently used "d-sin21/J" method. The apparatus for the measurements was a Q-goniometer with a Bragg-Brentano focusing beam arrangement and a position sensitive detector. X-ray fluorescence scans were also performed on the sample in order to gain information about its composition. Additionally, a scanning-electron-microscope was used to investigate its microstructure. The crystallographic texture of the platinum was also examined by x-ray diffraction and displayed in pole figures. 2023-09-07T11:18:44Z 2023-09-07T11:18:44Z 1999 2023-09-07T11:08:13Z Master Thesis Masters MSc http://hdl.handle.net/11427/38444 eng application/pdf Department of Physics Faculty of Science |
| spellingShingle | Physics Bollhofer, Axel Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction |
| thesis_degree_str | Master's |
| title | Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction |
| title_full | Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction |
| title_fullStr | Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction |
| title_full_unstemmed | Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction |
| title_short | Study of residual stress in a thin platinum layer by means of nondestructive x-ray diffraction |
| title_sort | study of residual stress in a thin platinum layer by means of nondestructive x ray diffraction |
| topic | Physics |
| url | http://hdl.handle.net/11427/38444 |
| work_keys_str_mv | AT bollhoferaxel studyofresidualstressinathinplatinumlayerbymeansofnondestructivexraydiffraction |