Full Text Available
Note: Clicking the button above will open the full text document at the original institutional repository in a new window.
Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques
Word processed copy.
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
Department of Physics
2014
|
| Subjects: | |
| Tags: |
No Tags, Be the first to tag this record!
|
| _version_ | 1867613154016493568 |
|---|---|
| access_status_str | Open Access |
| author | Adegbite, Olusegun |
| author_browse | Adegbite, Olusegun |
| author_facet | Adegbite, Olusegun |
| author_sort | Adegbite, Olusegun |
| collection | Thesis |
| description | Word processed copy. |
| format | Thesis |
| id | oai:open.uct.ac.za:11427/6522 |
| institution | University of Cape Town (South Africa) |
| language | eng |
| last_indexed | 2026-06-10T12:31:35.974Z |
| license_str | Not specified — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from UCTD — University of Cape Town Open Access Repository |
| publishDate | 2014 |
| publishDateRange | 2014 |
| publishDateSort | 2014 |
| publisher | Department of Physics |
| publisherStr | Department of Physics |
| record_format | dspace |
| source_str | UCTD — University of Cape Town Open Access Repository |
| spelling | oai:open.uct.ac.za:11427/6522 Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques Adegbite, Olusegun Physics Word processed copy. Includes bibliographical references (leaves 83-87). In this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of nanocrystalline silicon powder. The combinations of non destructive, quantitative and sensitive Rutherford backscattering, resonance scattering and elastic recoil detection analysis were used in analysing these samples. 2014-08-13T20:03:37Z 2014-08-13T20:03:37Z 2006 Master Thesis Masters M Sc http://hdl.handle.net/11427/6522 eng application/pdf Department of Physics Faculty of Science University of Cape Town |
| spellingShingle | Physics Adegbite, Olusegun Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques |
| thesis_degree_str | Master's |
| title | Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques |
| title_full | Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques |
| title_fullStr | Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques |
| title_full_unstemmed | Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques |
| title_short | Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques |
| title_sort | light element analysis in amorphous and nanocrystalline silicon using erda and related techniques |
| topic | Physics |
| url | http://hdl.handle.net/11427/6522 |
| work_keys_str_mv | AT adegbiteolusegun lightelementanalysisinamorphousandnanocrystallinesiliconusingerdaandrelatedtechniques |