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Residual stress in Pt coatings under thermal influence
Includes bibliographical references.
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| Main Author: | |
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| Other Authors: | |
| Format: | Thesis |
| Language: | English |
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Department of Physics
2014
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| _version_ | 1867613202061197312 |
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| access_status_str | Open Access |
| author | Ntsoane, T P |
| author2 | Härting, Margit |
| author_browse | Härting, Margit Ntsoane, T P |
| author_facet | Härting, Margit Ntsoane, T P |
| author_sort | Ntsoane, T P |
| collection | Thesis |
| description | Includes bibliographical references. |
| format | Thesis |
| id | oai:open.uct.ac.za:11427/8778 |
| institution | University of Cape Town (South Africa) |
| language | eng |
| last_indexed | 2026-06-10T12:32:21.936Z |
| license_str | Not specified — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from UCTD — University of Cape Town Open Access Repository |
| publishDate | 2014 |
| publishDateRange | 2014 |
| publishDateSort | 2014 |
| publisher | Department of Physics |
| publisherStr | Department of Physics |
| record_format | dspace |
| source_str | UCTD — University of Cape Town Open Access Repository |
| spelling | oai:open.uct.ac.za:11427/8778 Residual stress in Pt coatings under thermal influence Ntsoane, T P Härting, Margit Physics Includes bibliographical references. Resistance thermometers are commonly employed when accurate temperature measurements are required. The detection part consists of a thin metallic film deposited on a ceramic substrate. In this work, commercially manufactured Pt-Al₂O₃ composites annealed at 0°C, 300°C, 600°C and 1170°C above room temperature were investigated for residual stress using the non-destructive X-ray diffraction technique. The apparatus used for the investigation was a Ψ-goniometer with a scintillation detector. The measured data were analysed with "sin²Ψ"-method. The total stress yielded was found to be a superposition of both the thermal and intrinsic stress in the layer. Analytical model, following the method of Tsui and Clyne, was used to resolve the two stress contributions. With the thermal component being constant, the variation of the observed total stress was attributed to the relaxing intrinsic components. Further investigations of the samples included the microstructure studies using Scanning Electron Microscopy (SEM). 2014-10-25T18:59:51Z 2014-10-25T18:59:51Z 2001 Master Thesis Masters MSc http://hdl.handle.net/11427/8778 eng application/pdf Department of Physics Faculty of Science University of Cape Town |
| spellingShingle | Physics Ntsoane, T P Residual stress in Pt coatings under thermal influence |
| thesis_degree_str | Master's |
| title | Residual stress in Pt coatings under thermal influence |
| title_full | Residual stress in Pt coatings under thermal influence |
| title_fullStr | Residual stress in Pt coatings under thermal influence |
| title_full_unstemmed | Residual stress in Pt coatings under thermal influence |
| title_short | Residual stress in Pt coatings under thermal influence |
| title_sort | residual stress in pt coatings under thermal influence |
| topic | Physics |
| url | http://hdl.handle.net/11427/8778 |
| work_keys_str_mv | AT ntsoanetp residualstressinptcoatingsunderthermalinfluence |