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A structured review of the dark side of technostress : always, everywhere and anytime
Mini Dissertation (MPhil (Evidence Based Management))--University of Pretoria, 2024.
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| Format: | Thesis |
| Language: | English |
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University of Pretoria
2025
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| _version_ | 1867613614845722624 |
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| access_status_str | Open Access |
| author2 | Spooner, Vivienne |
| author_browse | Spooner, Vivienne |
| author_facet | Spooner, Vivienne |
| collection | Thesis |
| dc_rights_str_mv | © 2024 University of Pretoria. All rights reserved. The copyright in this work vests in the University of Pretoria. No part of this work may be reproduced or transmitted in any form or by any means, without the prior written permission of the University of Pretoria. |
| description | Mini Dissertation (MPhil (Evidence Based Management))--University of Pretoria, 2024. |
| format | Thesis |
| id | oai:repository.up.ac.za:2263/101854 |
| institution | University of Pretoria (South Africa) |
| language | English |
| last_indexed | 2026-06-10T12:38:57.201Z |
| license_str | Other — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from UPSpace — University of Pretoria Institutional Repository |
| publishDate | 2025 |
| publishDateRange | 2025 |
| publishDateSort | 2025 |
| publisher | University of Pretoria |
| publisherStr | University of Pretoria |
| record_format | dspace |
| source_str | UPSpace — University of Pretoria Institutional Repository |
| spelling | oai:repository.up.ac.za:2263/101854 A structured review of the dark side of technostress : always, everywhere and anytime Spooner, Vivienne ichelp@gibs.co.za Honwani, Katumetso Boipelo UCTD Technostress Technology Use Techno-Stressors Technology Ubiquity Dark Side Mini Dissertation (MPhil (Evidence Based Management))--University of Pretoria, 2024. The dark side of technostress is associated with the prevailing adoption and dependence on technology, and research investigates how and why using various technologies places demands on individuals, thus affecting their well-being. A paradigm shift induced by the fourth industrial revolution (IR4.0) has made technology a necessity and a ubiquitous part of an individual's professional, personal, and social life. Scholars have advocated for on-going research on technostress. Thus, this review took an interdisciplinary approach to understand the emerging developments of technostress in scholarship using inductive thematic analysis. Five themes were revealed from technostress literature, namely: technostress defined, types of technology and characteristics, technology-driven demands, adverse effects of the dark side of technostress, and multi-disciplinary nature of technostress. Applying a matrix on technology characteristics and demand-inducing stressors and network analysis of demand-inducing stressors and outcomes revealed that all the technology characteristics (usability, intrusive, dynamic) map with techno-overload, techno-invasion, and techno-insecurity, while the network analysis revealed that techno-overload, techno-invasion, techno-complexity, and techno-insecurity are the key demand-inducing stressors that result in both psychological and behavioural outcomes summarised to provide a framework on the interdisciplinary nature of the dark side of technostress. Gordon Institute of Business Science (GIBS) MPhil (Evidence Based Management) Unrestricted Gordon Institute of Business Science (GIBS) SDG-09: Industry, innovation and infrastructure 2025-04-02T07:08:52Z 2025-04-02T07:08:52Z 2025-05-05 2024-11 Mini Dissertation * A2025 http://hdl.handle.net/2263/101854 en © 2024 University of Pretoria. All rights reserved. The copyright in this work vests in the University of Pretoria. No part of this work may be reproduced or transmitted in any form or by any means, without the prior written permission of the University of Pretoria. application/pdf University of Pretoria |
| spellingShingle | UCTD Technostress Technology Use Techno-Stressors Technology Ubiquity Dark Side A structured review of the dark side of technostress : always, everywhere and anytime |
| title | A structured review of the dark side of technostress : always, everywhere and anytime |
| title_full | A structured review of the dark side of technostress : always, everywhere and anytime |
| title_fullStr | A structured review of the dark side of technostress : always, everywhere and anytime |
| title_full_unstemmed | A structured review of the dark side of technostress : always, everywhere and anytime |
| title_short | A structured review of the dark side of technostress : always, everywhere and anytime |
| title_sort | structured review of the dark side of technostress always everywhere and anytime |
| topic | UCTD Technostress Technology Use Techno-Stressors Technology Ubiquity Dark Side |
| url | http://hdl.handle.net/2263/101854 |