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Badat, S. 2025. Proton Single-Event Effects Tolerance Testing of a Vision Processing Unit for Satellite Use. Unpublished masters thesis. Stellenbosch: Stellenbosch University [online]. Available: https://scholar.sun.ac.za/items/ab66f6c1-dc89-48a2-ba4c-37f9d0e09a07
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| Format: | Thesis |
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Stellenbosch : Stellenbosch University
2025
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| _version_ | 1867614000030679040 |
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| access_status_str | Open Access |
| author | Badat, Sa'ad |
| author2 | Barnard, Arno |
| author_browse | Badat, Sa'ad Barnard, Arno |
| author_facet | Barnard, Arno Badat, Sa'ad |
| author_sort | Badat, Sa'ad |
| collection | Thesis |
| dc_rights_str_mv | Stellenbosch University |
| description | Badat, S. 2025. Proton Single-Event Effects Tolerance Testing of a
Vision Processing Unit for Satellite Use. Unpublished masters thesis. Stellenbosch: Stellenbosch University [online]. Available: https://scholar.sun.ac.za/items/ab66f6c1-dc89-48a2-ba4c-37f9d0e09a07 |
| format | Thesis |
| id | oai:scholar.sun.ac.za:10019.1/132057 |
| institution | Stellenbosch University (South Africa) |
| last_indexed | 2026-06-10T12:45:04.096Z |
| license_str | Other — see source repository |
| provenance_str_mv | Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository |
| publishDate | 2025 |
| publishDateRange | 2025 |
| publishDateSort | 2025 |
| publisher | Stellenbosch : Stellenbosch University |
| publisherStr | Stellenbosch : Stellenbosch University |
| record_format | dspace |
| source_str | SUNScholar — Stellenbosch University Repository |
| spelling | oai:scholar.sun.ac.za:10019.1/132057 Proton single-event effects tolerance testing of a vision processing unit for satellite use Badat, Sa'ad Barnard, Arno Stellenbosch University. Faculty of Engineering. Dept. of Electrical and Electronic Engineering. Semiconductors -- Effect of radiation on Computer vision Neural networks (Computer science) Space environment UCTD Badat, S. 2025. Proton Single-Event Effects Tolerance Testing of a Vision Processing Unit for Satellite Use. Unpublished masters thesis. Stellenbosch: Stellenbosch University [online]. Available: https://scholar.sun.ac.za/items/ab66f6c1-dc89-48a2-ba4c-37f9d0e09a07 Thesis (MEng)--Stellenbosch University, 2025. ENGLISH ABSTRACT: This thesis investigates the Single Event Effects (SEE) susceptibility of the Intel Movidius Myriad X Vision Processing Unit (VPU) when exposed to 66 MeV protons. The research makes use of an industry-standard computer vision model and a custom neural network designed specifically for SEE detection to perform testing with only API-level access to the device. Testing was performed using the YOLOv7-tiny object detection model and a custom single-layer network (PlusOne) designed to trace error propagation. The Myriad X exhibited SEE cross-sections in the range of 10−11 to 10−9 cm2 , with functional failure occurring at approximately 65.77 krad(Si). While numerous Single Event Upsets (SEUs) were observed, post-processing techniques proved effective at filtering many errorinduced predictions. Analysis of recurring errors provided insight into potential firmware vulnerabilities to SEE. The research also reveals opportunities for SEE-aware neural network design, suggesting that architectural modifications to networks could enhance radiation tolerance. AFRIKAANSE OPSOMMING: Hierdie tesis ondersoek die sensitiwiteit vir Enkelgebeurteniseffekte (SEE) van die Intel Movidius Myriad X Vision Verwerkingseenheid (VPU) wanneer dit blootgestel word aan 66 MeV protone. Die navorsing maak gebruik van ’n industrie-standaard rekenaarvisie-model en ’n persoonlike neurale netwerk wat spesifiek ontwerp is vir SEE-deteksie om toetsing uit te voer met slegs API-vlak toegang tot die toestel. Toetsing is uitgevoer met die YOLOv7-tiny objekdeteksiemodel en ’n persoonlike enkel-laag netwerk (PlusOne) wat ontwerp is om foutpropagasie na te spoor. Die Myriad X het SEE-deursnee-waardes tussen 10−11 tot 10−9 cm2 getoon, met funksionele mislukkings wat plaasgevind het by ongeveer 65.77 krad(Si). Terwyl talle Enkelgebeurtenis-omkerings (SEUs) waargeneem is, het na-verwerkingstegnieke effektief geblyk om baie fout-ge¨ınduseerde voorspellings uit te filter. Analise van herhalende foute het insig gebied in potensi¨ele firmware-kwesbaarhede vir SEE. Die navorsing onthul ook geleenthede vir SEE-bewuste neurale netwerkontwerp, wat daarop dui dat strukturele aanpassings aan netwerke stralingstoleransie kan verbeter. Masters 2025-05-21T10:37:20Z 2025-05-21T10:37:20Z 2025-03 Thesis https://scholar.sun.ac.za/handle/10019.1/132057 Stellenbosch University xi, 133 pages : illustrations application/pdf Stellenbosch : Stellenbosch University |
| spellingShingle | Semiconductors -- Effect of radiation on Computer vision Neural networks (Computer science) Space environment UCTD Badat, Sa'ad Proton single-event effects tolerance testing of a vision processing unit for satellite use |
| title | Proton single-event effects tolerance testing of a vision processing unit for satellite use |
| title_full | Proton single-event effects tolerance testing of a vision processing unit for satellite use |
| title_fullStr | Proton single-event effects tolerance testing of a vision processing unit for satellite use |
| title_full_unstemmed | Proton single-event effects tolerance testing of a vision processing unit for satellite use |
| title_short | Proton single-event effects tolerance testing of a vision processing unit for satellite use |
| title_sort | proton single event effects tolerance testing of a vision processing unit for satellite use |
| topic | Semiconductors -- Effect of radiation on Computer vision Neural networks (Computer science) Space environment UCTD |
| url | https://scholar.sun.ac.za/handle/10019.1/132057 |
| work_keys_str_mv | AT badatsaad protonsingleeventeffectstolerancetestingofavisionprocessingunitforsatelliteuse |