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Proton single-event effects tolerance testing of a vision processing unit for satellite use

Badat, S. 2025. Proton Single-Event Effects Tolerance Testing of a Vision Processing Unit for Satellite Use. Unpublished masters thesis. Stellenbosch: Stellenbosch University [online]. Available: https://scholar.sun.ac.za/items/ab66f6c1-dc89-48a2-ba4c-37f9d0e09a07

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Main Author: Badat, Sa'ad
Other Authors: Barnard, Arno
Format: Thesis
Published: Stellenbosch : Stellenbosch University 2025
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access_status_str Open Access
author Badat, Sa'ad
author2 Barnard, Arno
author_browse Badat, Sa'ad
Barnard, Arno
author_facet Barnard, Arno
Badat, Sa'ad
author_sort Badat, Sa'ad
collection Thesis
dc_rights_str_mv Stellenbosch University
description Badat, S. 2025. Proton Single-Event Effects Tolerance Testing of a Vision Processing Unit for Satellite Use. Unpublished masters thesis. Stellenbosch: Stellenbosch University [online]. Available: https://scholar.sun.ac.za/items/ab66f6c1-dc89-48a2-ba4c-37f9d0e09a07
format Thesis
id oai:scholar.sun.ac.za:10019.1/132057
institution Stellenbosch University (South Africa)
last_indexed 2026-06-10T12:45:04.096Z
license_str Other — see source repository
provenance_str_mv Harvested via OAI-PMH from SUNScholar — Stellenbosch University Repository
publishDate 2025
publishDateRange 2025
publishDateSort 2025
publisher Stellenbosch : Stellenbosch University
publisherStr Stellenbosch : Stellenbosch University
record_format dspace
source_str SUNScholar — Stellenbosch University Repository
spelling oai:scholar.sun.ac.za:10019.1/132057 Proton single-event effects tolerance testing of a vision processing unit for satellite use Badat, Sa'ad Barnard, Arno Stellenbosch University. Faculty of Engineering. Dept. of Electrical and Electronic Engineering. Semiconductors -- Effect of radiation on Computer vision Neural networks (Computer science) Space environment UCTD Badat, S. 2025. Proton Single-Event Effects Tolerance Testing of a Vision Processing Unit for Satellite Use. Unpublished masters thesis. Stellenbosch: Stellenbosch University [online]. Available: https://scholar.sun.ac.za/items/ab66f6c1-dc89-48a2-ba4c-37f9d0e09a07 Thesis (MEng)--Stellenbosch University, 2025. ENGLISH ABSTRACT: This thesis investigates the Single Event Effects (SEE) susceptibility of the Intel Movidius Myriad X Vision Processing Unit (VPU) when exposed to 66 MeV protons. The research makes use of an industry-standard computer vision model and a custom neural network designed specifically for SEE detection to perform testing with only API-level access to the device. Testing was performed using the YOLOv7-tiny object detection model and a custom single-layer network (PlusOne) designed to trace error propagation. The Myriad X exhibited SEE cross-sections in the range of 10−11 to 10−9 cm2 , with functional failure occurring at approximately 65.77 krad(Si). While numerous Single Event Upsets (SEUs) were observed, post-processing techniques proved effective at filtering many errorinduced predictions. Analysis of recurring errors provided insight into potential firmware vulnerabilities to SEE. The research also reveals opportunities for SEE-aware neural network design, suggesting that architectural modifications to networks could enhance radiation tolerance. AFRIKAANSE OPSOMMING: Hierdie tesis ondersoek die sensitiwiteit vir Enkelgebeurteniseffekte (SEE) van die Intel Movidius Myriad X Vision Verwerkingseenheid (VPU) wanneer dit blootgestel word aan 66 MeV protone. Die navorsing maak gebruik van ’n industrie-standaard rekenaarvisie-model en ’n persoonlike neurale netwerk wat spesifiek ontwerp is vir SEE-deteksie om toetsing uit te voer met slegs API-vlak toegang tot die toestel. Toetsing is uitgevoer met die YOLOv7-tiny objekdeteksiemodel en ’n persoonlike enkel-laag netwerk (PlusOne) wat ontwerp is om foutpropagasie na te spoor. Die Myriad X het SEE-deursnee-waardes tussen 10−11 tot 10−9 cm2 getoon, met funksionele mislukkings wat plaasgevind het by ongeveer 65.77 krad(Si). Terwyl talle Enkelgebeurtenis-omkerings (SEUs) waargeneem is, het na-verwerkingstegnieke effektief geblyk om baie fout-ge¨ınduseerde voorspellings uit te filter. Analise van herhalende foute het insig gebied in potensi¨ele firmware-kwesbaarhede vir SEE. Die navorsing onthul ook geleenthede vir SEE-bewuste neurale netwerkontwerp, wat daarop dui dat strukturele aanpassings aan netwerke stralingstoleransie kan verbeter. Masters 2025-05-21T10:37:20Z 2025-05-21T10:37:20Z 2025-03 Thesis https://scholar.sun.ac.za/handle/10019.1/132057 Stellenbosch University xi, 133 pages : illustrations application/pdf Stellenbosch : Stellenbosch University
spellingShingle Semiconductors -- Effect of radiation on
Computer vision
Neural networks (Computer science)
Space environment
UCTD
Badat, Sa'ad
Proton single-event effects tolerance testing of a vision processing unit for satellite use
title Proton single-event effects tolerance testing of a vision processing unit for satellite use
title_full Proton single-event effects tolerance testing of a vision processing unit for satellite use
title_fullStr Proton single-event effects tolerance testing of a vision processing unit for satellite use
title_full_unstemmed Proton single-event effects tolerance testing of a vision processing unit for satellite use
title_short Proton single-event effects tolerance testing of a vision processing unit for satellite use
title_sort proton single event effects tolerance testing of a vision processing unit for satellite use
topic Semiconductors -- Effect of radiation on
Computer vision
Neural networks (Computer science)
Space environment
UCTD
url https://scholar.sun.ac.za/handle/10019.1/132057
work_keys_str_mv AT badatsaad protonsingleeventeffectstolerancetestingofavisionprocessingunitforsatelliteuse